Next Generation Technology-Enhanced Assessment: Global...

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Next Generation Technology-Enhanced...

Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupational and Workplace Testing

John C. Scott (editor), Dave Bartram (editor), Douglas H. Reynolds (editor)

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Год:

2017

Издательство:

Cambridge University Press

Язык:

english

Страницы:

440

ISBN 10:

1107124360

ISBN 13:

9781107124363

Серия:

Educational and Psychological Testing in a Global Context

Файл:

PDF, 29.48 MB

IPFS:

,

english, 2017

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