Bias Temperature Instability for Devices and Circuits

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Bias Temperature Instability for Devices and Circuits

Name: Bias Temperature Instability for Devices and Circuits
ISBN: 9781461479093

Andreas Kerber, Eduard Cartier (auth.), Tibor Grasser (eds.)

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This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Категории:

Engineering

Год:

2014

Издание:

Издательство:

Springer-Verlag New York

Язык:

english

Страницы:

810

ISBN 10: